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Electrothermal Analysis of VLSI Systems 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Yi-Kan Cheng 作者

Springer

译者

2000-06-30 出版日期

233 页数

USD 175.00 价格

Hardcover

丛书系列

9780792378617 图书编码

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Electrothermal Analysis of VLSI Systems 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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Electrothermal Analysis of VLSI Systems 在线电子书 pdf 下载 txt下载 epub 下载 mobi 在线电子书下载

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Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems. Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration). Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis. Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.

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