Exploring Scanning Probe Microscopy with Mathematica 在線電子書 pdf 下載 txt下載 epub 下載 mobi 下載 2024

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Sarid, Dror 作者

John Wiley & Sons Inc

譯者

出版日期

310 頁數

$ 230.00 價格

HRD

叢書系列

9783527406173 圖書編碼

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發表於2024-11-13

Exploring Scanning Probe Microscopy with Mathematica 在線電子書 epub 下載 mobi 下載 pdf 下載 txt 下載 2024

Exploring Scanning Probe Microscopy with Mathematica 在線電子書 epub 下載 pdf 下載 mobi 下載 txt 下載 2024

Exploring Scanning Probe Microscopy with Mathematica 在線電子書 pdf 下載 txt下載 epub 下載 mobi 下載 2024

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Exploring Scanning Probe Microscopy with Mathematica 在線電子書 pdf 下載 txt下載 epub 下載 mobi 在線電子書下載

Exploring Scanning Probe Microscopy with Mathematica 在線電子書圖書描述

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

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