具体描述
Book InformationThe booming use of micro-chips that handle full functionality for a wireless application, coupled with the increasing number of integrated analog/digital wireless devices being developed, has created a need for the merger and rethinking of past testing approaches for wireless equipment. Addressing this issue head-on, this first-of-its-kind resource offers professionals an in-depth overview of cutting-edge RF (radio frequency) and SOC (system on a chip) product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. Practitioners learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices.ContentsIntroduction. The Radio Architecture in Wireless Telecommunications. Moving towards the System on a Chip (SOC). The Importance of Testing. Cost of Test. Production Testing of RF Devices. Production Testing of SOC Devices. Fundamentals of Analog and Mixed Signal Testing, Moving Beyond Traditional Production Testing, Noise Testing, Appendix.
