The "Handbook of Surface and Interface Analysis: Methods for Problem-Solving" describes the physical basis and technical implementation of the most commonly used techniques for materials characterization. Providing an overview of the benefits and limitations for each methodology, this second edition features five brand new chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials. This volume combines the expertise from a distinguished group of scientists into a comprehensive, integrated source of information on the characterization methods considered crucial in this field.
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