Advanced Production Testing of RF, SoC, and SiP Devices 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024


Advanced Production Testing of RF, SoC, and SiP Devices

简体网页||繁体网页
Joe Kelly 作者
Artech House Publishers
译者
2006-11 出版日期
326 页数
USD 99.00 价格
Hardcover
丛书系列
9781580537094 图书编码

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发表于2024-11-27


Advanced Production Testing of RF, SoC, and SiP Devices 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

Advanced Production Testing of RF, SoC, and SiP Devices 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

Advanced Production Testing of RF, SoC, and SiP Devices 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024



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Advanced Production Testing of RF, SoC, and SiP Devices 在线电子书 pdf 下载 txt下载 epub 下载 mobi 在线电子书下载

Advanced Production Testing of RF, SoC, and SiP Devices 在线电子书 图书描述

Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before.

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