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This book covers state–of–the–art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X–ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X–ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X–ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
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很基础，适合做入门教材
评分one book three years hao ding zan
评分one book three years hao ding zan
评分one book three years hao ding zan
评分A very concise book that covers several important characterization techniques.
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