Defects in Microelectronic Materials and Devices pdf epub mobi txt 电子书下载 2025

简体网页||繁体网页

☆☆☆☆☆

Gate Dielectric Breakdown 方面各界大牛

出版者:

作者:Fleetwood, Daniel/ Pantolides, Sokrates/ Schrimpf, Ronald D.

出品人:

页数:770

译者:

出版时间:

价格:1258.00 元

装帧:

isbn号码:9781420043761

丛书系列:

图书标签:

半导体

下载链接在页面底部

facebook linkedin mastodon messenger pinterest reddit telegram twitter viber vkontakte whatsapp 复制链接

想要找书就要到图书目录大全

book.wenda123.org

立刻按 ctrl+D收藏本页

你会得到大惊喜!!

Uncover the Defects that Compromise Performance and Reliability

As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.