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出版者:American Institute of Physics

作者:Ripple, Dean C. 编

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页数:1174

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出版时间:2003-11-11

价格:USD 295.00

装帧:Hardcover

isbn号码:9780735401532

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All papers in this volume were peer reviewed by two reviewers for each paper. This volume describes recent developments in thermometry, process control, and related materials properties. Topics covered include: temperature standards; characterization and development of both common and novel thermometer types; uncertainties and calibration methods; results of recent international comparisons; hardware and methods for temperature control; and applications in the semiconductor and metal processing industries.