Focused Ion Beam Systems 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Nan, Yao 编作者

译者

2007-9 出版日期

408 页数

$ 227.13 价格

丛书系列

9780521831994 图书编码

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发表于2024-11-10

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Focused Ion Beam Systems 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

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