ESD Design for Analog Circuits 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024


ESD Design for Analog Circuits

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Vladislav A. Vashchenko 作者
Springer; 1st Edition
译者
2010-8-11 出版日期
457 页数
USD 179.00 价格
丛书系列
9781441965646 图书编码

ESD Design for Analog Circuits 在线电子书 图书标签: IC  英文原版  专业书   


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ESD Design for Analog Circuits 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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Product Description

This book is on high voltage and system level circuit design. It covers many challenging ESD topics related to analog circuit design for both ESD device and ESD circuits at the network level. Included is extensive discussion of analog design for DC-DC buck/boost converters, level shifters, digital-analog converters, high speed and precision power amplifiers, and system level cable specs for interface applications.

About the Author

Dr. Vladislav Vashchenko received MS, Engineer-Physicist (1986) followed by “Ph.D. in Physics of Semiconductors” (1990) from Moscow Institute of Physics and Technology for the study of self-organization phenomena in semiconductor structures under breakdown. Since 1984 he was working in reliability department of State Research Institute “Pulsar” (Moscow) occupying positions from the student intern to head of laboratory. In 1997 he was awarded the “Doctor of Science in Microelectronics” degree for the cycle of studies and new solutions of the reliability problems in power GaAs MESFET’s, microwave silicon devices and the developed test methods. In the period 1995-1997 he managed the work on contracts for high reliability components for Russian Space Agency, commercial and military customers. In 2000 he joined Advanced Process Development Group in National Semiconductor Corp. to work on design of the ESD protection solutions for analog products. Currently he is leader and manager of R&D group responsible for ESD development for new processes and products. His current research interests are mainly focused on the power devices, device level reliability, ESD solutions, physical process and device simulation for ESD. His studies are widely presented in major device research forums. He author of 108 U.S. patents and over 80 research and review papers in the fields of reliability and ESD.

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