Embedded Processor-Based Self-Test

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出版者:Springer
作者:Dimitris Gizopoulos
出品人:
页数:236
译者:
出版时间:2004-12-20
价格:USD 129.00
装帧:Hardcover
isbn号码:9781402027857
丛书系列:
图书标签:
  • 测试
  • 嵌入式软件
  • 嵌入式处理器
  • 自检测试
  • 硬件测试
  • 数字系统测试
  • DFT
  • 可靠性工程
  • 测试技术
  • 故障诊断
  • 嵌入式系统
  • 处理器测试
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具体描述

Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.

《Embedded Processor-Based Self-Test》探索嵌入式系统中以处理器为核心的自检技术,其精髓在于通过高效可靠的自主诊断机制提升系统运行稳定性与安全性。该书深入剖析了现代嵌入式设备中广泛采用的微控制器和专用处理器如何集成自检功能,涵盖从硬件层级设计到软件实现的全流程。本书以实际工程案例为基础,展示了自检机制在传感器网络、工业自动化、智能医疗设备等关键领域中的应用模式。内容重点包括基于处理器内部资源的高效诊断算法开发,如看门狱检测、自我校准程序执行监控及异常状态快速响应策略。书中特别强调自检系统与实时操作系统(RTOS)的深度融合,详细描述了如何在有限计算资源下实现高精度故障识别,同时兼顾功耗与响应速度。此外,本书还深入介绍了基于硬件辅助功能的测试方法,如利用处理器的内置测量单元(BME)进行周期性性能校准,以及通过自诊断指令生成实现设备健康状态可视化追踪。技术细节涵盖自检流程设计、算法优化方案、自动化测试脚本编写及系统集成实践,内容基于多家企业的工程实践整理而成,避免任何模糊描述或泛泛提及。读者可在此书中获得对嵌入式自检机制从理论到落地的完整认知,了解如何通过精准的硬件处理器功能提升设备寿命与运维效率,为构建高可靠性嵌入式系统提供坚实技术支撑。

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