Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library) 在線電子書 pdf 下載 txt下載 epub 下載 mobi 下載 2024


Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library)

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R.M.A. Azzam 作者
North Holland
譯者
1987-04-01 出版日期
558 頁數
USD 71.95 價格
Paperback
叢書系列
9780444870162 圖書編碼

Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library) 在線電子書 圖書標籤: 外國  science   


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Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library) 在線電子書 epub 下載 mobi 下載 pdf 下載 txt 下載 2024

Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library) 在線電子書 epub 下載 pdf 下載 mobi 下載 txt 下載 2024

Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library) 在線電子書 pdf 下載 txt下載 epub 下載 mobi 下載 2024



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Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library) 在線電子書 著者簡介


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Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library) 在線電子書 pdf 下載 txt下載 epub 下載 mobi 在線電子書下載

Ellipsometry and Polarized Light, First Edition (North-Holland Personal Library) 在線電子書 圖書描述

Ellipsometry is a unique optical technique of great sensitivity for in situ non-destructive characterization of surface (inter-facial) phenomena (reactions) utilizing the change in the state of polarization of a light-wave probe. Although known for almost a century, the use of ellipsometry has increased rapidly in the last two decades. Among the most significant recent developments are new applications, novel and automated instrumentation and techniques for error-free data analysis.

This book provides the necessary analytical and experimental tools needed for competent understanding and use of these developments. It is directed to those who are already working in the field and, more importantly, to the newcomer who would otherwise have to sift through several hundred published papers. The authors first present a comprehensive study of the different mathematical representations of polarized light and how such light is processed by optical systems, going on to show how these tools are applied to the analysis of ellipsometer systems. To relate ellipsometric measurements to surface properties, use is then made of electromagnetic theory. Experimental techniques and apparatus are described and the many interesting applications of ellipsometry to surface and thin-film phenomena are reviewed.

This reference work is addressed to researchers and students with a strong interest in surface and thin-film physics and optics and their applications. It is a must for libraries in the fields of solid state physics, physical chemistry, electro-chemistry, metallurgy and optical engineering.

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