Scanning Electron Microscopy and X-ray Microanalysis 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Joseph Goldstein 作者

Springer

译者

2003-2 出版日期

689 页数

USD 99.00 价格

Hardcover

丛书系列

9780306472923 图书编码

Scanning Electron Microscopy and X-ray Microanalysis 在线电子书图书标签: SEM materials 表征类材料/research 材料学地球科学 coursebook EM

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Scanning Electron Microscopy and X-ray Microanalysis 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

Scanning Electron Microscopy and X-ray Microanalysis 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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评分☆☆☆☆☆

大部分是地质学的例子，仅供参考，还算不错的教材。

评分☆☆☆☆☆

大部分是地质学的例子，仅供参考，还算不错的教材。

评分☆☆☆☆☆

大部分是地质学的例子，仅供参考，还算不错的教材。

评分☆☆☆☆☆

大部分是地质学的例子，仅供参考，还算不错的教材。

评分☆☆☆☆☆

大部分是地质学的例子，仅供参考，还算不错的教材。

Scanning Electron Microscopy and X-ray Microanalysis 在线电子书著者简介

Scanning Electron Microscopy and X-ray Microanalysis 在线电子书图书目录

Scanning Electron Microscopy and X-ray Microanalysis 在线电子书 pdf 下载 txt下载 epub 下载 mobi 在线电子书下载

Scanning Electron Microscopy and X-ray Microanalysis 在线电子书图书描述

Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.

This third edition has been extensively revised, including new sections on:

* Variable-pressure SEM,

* Electron backscatter diffraction (EBSD),

* Recent developments in x-ray detectors,

and expanded coverage of:

* Low-voltage SEM,

* X-ray mapping,

* Specimen preparation.

The text has been used in educating over 3,000 students at the Lehigh Microscopy School SEM short course as well as thousands of undergraduate and graduate students at universities worldwide.

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