Scanning Electron Microscopy and X-ray Microanalysis 在線電子書 pdf 下載 txt下載 epub 下載 mobi 下載 2024

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Joseph Goldstein 作者

Springer

譯者

2003-2 出版日期

689 頁數

USD 99.00 價格

Hardcover

叢書系列

9780306472923 圖書編碼

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書圖書標籤: SEM materials 錶徵類材料/research 材料學地球科學 coursebook EM

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發表於2024-12-25

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書 epub 下載 mobi 下載 pdf 下載 txt 下載 2024

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書 epub 下載 pdf 下載 mobi 下載 txt 下載 2024

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書 pdf 下載 txt下載 epub 下載 mobi 下載 2024

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書用戶評價

評分☆☆☆☆☆

大部分是地質學的例子，僅供參考，還算不錯的教材。

評分☆☆☆☆☆

大部分是地質學的例子，僅供參考，還算不錯的教材。

評分☆☆☆☆☆

大部分是地質學的例子，僅供參考，還算不錯的教材。

評分☆☆☆☆☆

大部分是地質學的例子，僅供參考，還算不錯的教材。

評分☆☆☆☆☆

大部分是地質學的例子，僅供參考，還算不錯的教材。

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書著者簡介

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書 pdf 下載 txt下載 epub 下載 mobi 在線電子書下載

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書圖書描述

Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.

This third edition has been extensively revised, including new sections on:

* Variable-pressure SEM,

* Electron backscatter diffraction (EBSD),

* Recent developments in x-ray detectors,

and expanded coverage of:

* Low-voltage SEM,

* X-ray mapping,

* Specimen preparation.

The text has been used in educating over 3,000 students at the Lehigh Microscopy School SEM short course as well as thousands of undergraduate and graduate students at universities worldwide.

Scanning Electron Microscopy and X-ray Microanalysis 在線電子書下載 mobi epub pdf txt 在線電子書下載

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