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High-Resolution X-Ray Scattering 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Ullrich Pietsch 作者

Springer

译者

2004-8-27 出版日期

424 页数

USD 169.00 价格

Hardcover

Advanced Texts in Physics 丛书系列

9780387400921 图书编码

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High-Resolution X-Ray Scattering 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.

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