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Bhushan, Bharat (EDT)/ Fuchs, Harald (EDT) 作者

Springer Verlag

译者

2005-10 出版日期

328 页数

$ 224.87 价格

HRD

丛书系列

9783540269120 图书编码

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Applied Scanning Probe Methods IV 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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Applied Scanning Probe Methods IV 在线电子书图书描述

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.

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