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Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Sachdev, Manoj/ de Gyvez, Jose Pineda 作者

Springer Verlag

译者

2007-6 出版日期

352 页数

$ 213.57 价格

HRD

丛书系列

9780387465463 图书编码

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Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

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