Microscopy of Semiconducting Materials 2007 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Cullis, A. G. (EDT)/ Midgley, P. A. (EDT) 作者

译者

2008-5 出版日期

512 页数

$ 337.87 价格

丛书系列

9781402086144 图书编码

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Microscopy of Semiconducting Materials 2007 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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Microscopy of Semiconducting Materials 2007 在线电子书图书描述

The fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2-5 April, 2007. It was organised by the Institute of Physics, with co-sponsorship by the Royal Microscopical Society and endorsement by the Materials Research Society. The conference focused upon the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy, scanning probe microscopy and X-ray-based methods.Conference sessions concentrated on key topics including state-of-the-art studies in high resolution imaging and analytical electron microscopy, advanced scanning probe microscopy, scanning electron microscopy and focused ion beam applications, novel epitaxial layer phenomena, the properties of quantum nanostructures, III-nitride developments, GeSi/Si for advanced devices, metal-semiconductor contacts and silicides and the important effects of critical device processing treatments. Accordingly, this volume should be of direct interest to researchers in areas ranging from fundamental studies to electronic device assessment.

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