Electromagnetic Compatibility of Integrated Circuits 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024


Electromagnetic Compatibility of Integrated Circuits

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Ben Dhia, Sonia (EDT)/ Ramdani, Mohamed (EDT)/ Sicard, Etienne (EDT) 作者
Springer
译者
2005-12-09 出版日期
488 页数
USD 109.00 价格
Hardcover
丛书系列
9780387266008 图书编码

Electromagnetic Compatibility of Integrated Circuits 在线电子书 图书标签: 英文原版  专业书  IC   


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Electromagnetic Compatibility of Integrated Circuits 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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Electromagnetic Compatibility of Integrated Circuits 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024



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Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. The companion CD-ROM includes software illustrating key aspects of the book and a collection of demo tools applicable to EMC analysis of ICs.

From the Back Cover

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. The companion CD-ROM includes software illustrating key aspects of the book and a collection of demo tools applicable to EMC analysis of ICs.

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