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Testing of Digital Systems 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Jha, Niraj K./ Gupta, Sandeep 作者

Cambridge Univ Pr

译者

2003-5 出版日期

1016 页数

$ 195.49 价格

HRD

丛书系列

9780521773560 图书编码

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Testing of Digital Systems 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

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Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

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