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X-Ray Scattering from Semiconductors 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

X-Ray Scattering from Semiconductors
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简体网页||繁体网页
Fewster, Paul F. 作者
译者
2001-2 出版日期
300 页数
$ 99.00 价格
丛书系列
9781860941597 图书编码

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X-Ray Scattering from Semiconductors 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

X-Ray Scattering from Semiconductors 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

X-Ray Scattering from Semiconductors 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024


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suitable for researchers in semiconductor materials/thin films

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suitable for researchers in semiconductor materials/thin films

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suitable for researchers in semiconductor materials/thin films

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suitable for researchers in semiconductor materials/thin films

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suitable for researchers in semiconductor materials/thin films

X-Ray Scattering from Semiconductors 在线电子书 著者简介

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X-Ray Scattering from Semiconductors 在线电子书 pdf 下载 txt下载 epub 下载 mobi 在线电子书下载

X-Ray Scattering from Semiconductors 在线电子书 图书描述

X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more. This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which is common to materials other than semiconductors.

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