Design, Automation, and Test in Europe pdf epub mobi txt 電子書下載2025

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出版者:

作者:Lauwereins, Rudy (EDT)/ Madsen, Jan (EDT)

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頁數:528

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出版時間:2008-1

價格:$ 145.77

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isbn號碼:9781402064876

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In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.