Reliability Wearout Mechanisms in Advanced CMOS Technologies 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Strong, Alvin W./ Wu, Ernest Y./ Vollertsen, Rolf-peter/ Sune, Jordi/ La Rosa, Guiseppe 作者

译者

2009-8 出版日期

624 页数

1204.00 元价格

丛书系列

9780471731726 图书编码

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Reliability Wearout Mechanisms in Advanced CMOS Technologies 在线电子书 epub 下载 mobi 下载 pdf 下载 txt 下载 2024

Reliability Wearout Mechanisms in Advanced CMOS Technologies 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024

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Reliability Wearout Mechanisms in Advanced CMOS Technologies 在线电子书著者简介

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Reliability Wearout Mechanisms in Advanced CMOS Technologies 在线电子书 pdf 下载 txt下载 epub 下载 mobi 在线电子书下载

Reliability Wearout Mechanisms in Advanced CMOS Technologies 在线电子书图书描述

A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: Introduction to Reliability Gate Dielectric Reliability Negative Bias Temperature Instability Hot Carrier Injection Electromigration Reliability Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.

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