Stress-induced Phenomena in Metallization 在线电子书 图书标签:
发表于2024-11-25
Stress-induced Phenomena in Metallization 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024
The conference was on reliability related science in ULSI interconnect. Its main purpose was to discuss the stress induced phenomena in the LSI interconnect among academic researchers and industry engineers to establish academic science and to improve the reliability of ULSI chips. All papers were peer reviewed.
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Stress-induced Phenomena in Metallization 在线电子书 pdf 下载 txt下载 epub 下载 mobi 下载 2024